Skip to main content

DPA-111-v2.0 Overview of Scanning Acoustic Microscopy (SAM) Analysis

This course introduce the Scanning Acoustic Microscopy (SAM) as a technique for the specific detection of the most frequent anomalies in materials and electronic components.
Enrollment in this course is by invitation only

Sobre este Curso

This course has been designed by the engineering team at ALTER Technology, a leader since 1986 in testing services for electronic components in critical environments.

Scanning Acoustic Microscopy (SAM) is a reliable and powerful tool for non-destructive inspection in sectors such as space, defense, aerospace, automotive, power and energy, and material analysis.<br><br>

Estimated Duration: [Information not available in the sources.]<br><br>

Prerequisites: No previous knowledge is required, as the course is designed at the Fundamentals level (Level 1).<br><br>

Final Qualification: Upon completion, the student will understand the fundamentals of SAM, including acoustic impedance and the phase inversion phenomenon, the different scan modes (A-SAM, C-SAM, T-SAM), and the key rejection criteria for internal anomalies (cracks, delamination, voids) according to specification systems such as J-STD-020E and ESCC 25200.

¿A Quién va Dirigido?

This course is ideal for personnel without prior experience or new hires who seek to acquire the technical fundamentals and key concepts related to the essential theory of Scanning Acoustic Microscopy (SAM).

Equipo del Curso