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Overview of Scanning Acoustic Microscopy (SAM) analysis

This course introduce the Scanning Acoustic Microscopy (SAM) as a technique for the specific detection of the most frequent anomalies in materiales and electronic components.
Enrollment in this course is by invitation only

About This Course

This course helps to the best understanding of the Scanning Acoustic Microscopy (SAM) technique, as well as its importance and reliability in detecting defects in electronic components in a non-destructive way.

Nowadays plastic encapsulated parts are used in most microelectronics systems. However, plastic encapsulation involves some inherent risks such as corrosion, popcorn cracking, wire necking/breaking, and others leading to catastrophic failures.

Scanning Acoustic Microscopy has revealed as the most effective and complete non-destructive approach for the detection of critical and latent anomalies within plastic encapsulated parts, either before soldering and on assembled systems: Therefore it is routinely used and required to screen out potentially defective parts before the implementation into different industrial sectors such as automotive, military industry, avionics, space applications, and others.

Among the main objectives are:
- To understand the basics of the SAM technique and which defects can be detected.
- To illustrate the different scanning-modes, and how they help interpret the defects.
- To present the tool offered by ALTER TECHNOLOGY, Virtual Lab, a online platform focused on the last step of the production chain for space market according to the Industry 4.0 concept.

Scanning Acoustic Microscopy is a very complex technique. Thus, a suitable inspection not only requires reliable equipment, but more importantly, trained, and experienced staff with a deep knowledge about the fundamentals of the technique, its capabilities, and the inspected parts. Therefore in ALTER Technology, the Scanning Acoustic Microscopy Lab involves a qualified (Ph.D., M.Sc.) and multidisciplinary team specialized in different disciplines such as Materials Science, Physics, Electronics; together with a highly experienced technical staff with a solid background in microscopy, materials analysis and EEE inspection. This team is supported by more than 30 years of experience in ALTER Technology in EEE testing and engineering.

Course Staff

Course Staff Image #1

Francisco Javier Aparicio Rebollo

Leader of the SAM Laboratory of ALTER Technology. He has developed an extensive research career with more than 30 scientific papers in indexed journals and more than 70 contributions to international conferences. Principal investigator of international and national research projects.

Course Staff Image #1

Raquel Irene Cano Cordero

Degree in Material Engineering and a Master in Materials Science. Master thesis project about "One Dimensional Nanotubes as Highly Sensitive Surface-Enhanced Raman Scattering (SERS) Based Sensors" at the Institute of Materials Science of Seville. SAM Analyst in ALTER Technology.

Course Staff Image #2

Manuel Domínguez Álvarez

Chief Digital Officer in ALTER Technology Group


How much time should I invest in completing the course?

The course will be divided into several sessions distributed in modules. You should expect to spend 2-3 hours per week to complete the course, including: Going through the material / Viewing the videos and demonstrations / Completing exercises / Participation / Further reading

Will I receive a certificate for completing this course?

Of course. You will receive a certificate validated by EdX, the official online course platform of the Massachusetts Institute of Technology (MIT) and the University of Harvard with more than 10 million users, and by ALTER Technology, a company with more than 30 years of experience in the EEE components sector.